Instrument Overview
200 kV scanning transmission electron microscope with 4D-STEM, EDS, ADF, HAADF, bright-field and backscattered electron detectors. Capable of atomic resolution imaging in both TEM and STEM modalities. Protochips – Atmosphere system is also available for observing structural/chemical changes of materials in gaseous environments within the NEOARM.
Applications:
- Assessing radiation damage down to the atomic scale
- Chemical characterisation of materials
- Nano-particle/precipitates dispersion mapping
- Observing phase segregation
- Magnetic fields and strain mapping
- Observing microstructural and chemical changes of materials in gaseous environments
NEOARM Technical Specification:
- Maximum BF/DF resolution – TEM: 2.70 Å, STEM: 0.82 Å
- 4D STEM – Direct electron detection, up to 2000 fps in 12-bit mode
- EDS – Dual EDS detectors with combined solid angle of 2.2 sr
Protochips Technical Specification:
- Currently available gasses: He, N2, Ar (more to be added)
- Heating – Up to 1000oC, maximum ramping rate 10oC/s
- Gas flow rate – From 0.005 – 1 mL/min
- Maximum experimental gas pressure – 1 atmosphere
- Three gas inputs + two gas tanks for experimental gas mixing