JEOL NEOARM Scanning Transmission Electron Microscope

Instrument Overview

200 kV scanning transmission electron microscope with 4D-STEM, EDS, ADF, HAADF, bright-field and backscattered electron detectors. Capable of atomic resolution imaging in both TEM and STEM modalities. Protochips – Atmosphere system is also available for observing structural/chemical changes of materials in gaseous environments within the NEOARM.

Applications:

• Assessing radiation damage down to the atomic scale
• Chemical characterisation of materials
• Nano-particle/precipitates dispersion mapping
• Observing phase segregation
• Magnetic fields and strain mapping
• Observing microstructural and chemical changes of materials in gaseous environments

NEOARM Technical Specification:

• Maximum BF/DF resolution – TEM: 2.70 Å, STEM: 0.82 Å
• 4D STEM – Direct electron detection, up to 2000 fps in 12-bit mode
• EDS – Dual EDS detectors with combined solid angle of 2.2 sr

Protochips Technical Specification:

• Currently available gasses: He, N2, Ar (more to be added)
• Heating – Up to 1000oC, maximum ramping rate 10oC/s
• Gas flow rate – From 0.005 – 1 mL/min
• Maximum experimental gas pressure – 1 atmosphere
• Three gas inputs + two gas tanks for experimental gas mixing