Instrument Overview:
The instrument is equipped with a full range of detectors for multi-scale characterisation of samples.
- Secondary electron detector (SE) sensitive to sample’s topography changes.
- Backscattered-electron detector (BSE) which provides imaging that carries information on the sample’s composition.
- Energy-dispersive x-ray (EDX) allowing chemical characterisation of materials.
- electron backscatter diffraction detector (EBSD) for microstructural-crystallographic characterisation of samples.
Applications:
- High resolution microscopy
- Grain size analysis
- Post corrosion studies
- Porosity measurements
- Chemical composition (±1 at%)
Technical Specification:
- High brightness Field Emission Gun (Schottky emitter) for high-resolution/ high current/ low-noise imaging (up to 70nA of beam current)
- Resolution up to 1.2nm at 30kV
- Oxford Instruments X-Max 80 EDX detector (can detect elemental composition including Be)
- Oxford Instruments Symmetry 2 EBSD detector (up to 4500 patterns per second acquisition)
- Sample holders for Transmission Kikuchi Diffraction (TKD)
![The Tescan scanning electron microscope in its research room](/wp-content/uploads/2023/11/CP22-069-027-1.jpg)
The Tescan scanning electron microscope in its research room
![The TESCAN scanning electron microscope being remotely loaded](/wp-content/uploads/2023/11/CP18-331-023-1.jpg)
The TESCAN scanning electron microscope being remotely loaded
![TEBSD image of reactor pressure vessel steel with an array of indents for correlating mechanical properties with crystal orientation](/wp-content/uploads/2023/11/CP23-076-001-1.jpg)
EBSD image of reactor pressure vessel steel with an array of indents for correlating mechanical properties with crystal orientation
![EBSD image of G91/316 steel bond](/wp-content/uploads/2023/11/CP23-075-001-1.jpg)
EBSD image of G91/316 steel bond